| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ 50033/156-2002 |
Semiconductor discrete devices Detail specification for type 3DA505 silicon microwave pulse power transistor |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 20522-2006 |
Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB 12300-1990 |
Test methods of safe operating area for power transistors |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1603-1980 |
|
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 4589.1-1989 |
Semiconductor devices Generic specification for discrete devices and integrated circuits |
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| DB52/T 1104-2016 |
Junction-to-case thermal resistance transient test method of semiconductor devices |
|
via email in
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 11499-2001 |
Letter symbols for discrete semiconductor devices |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB/T 4937.201-2018 |
Semiconductor devices—Mechanical and climatic test methods—Part 20-1:Handling,packing,labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB/T 18910.11-2012 |
Liquid crystal display devices - Part 1-1: Terminology and symbols |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB/T 4937.20-2018 |
Semiconductor devices—Mechanical and climatic test methods—Part 20:Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 50033/154-2002 |
Semiconductor discrete devices Detail specification for type 3DG251 silicon UHF low-noise transistor |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 29827-2013 |
Information security technology—Trusted computing specification—Motherboard function and interface of trusted platform |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB/T 4937.2-2006 |
Semiconductor devices―Mechanical and climatic test methods―Part 2: Low air pressure |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 50033/158-2002 |
Semiconductor discrete devices Detail specification for type 3DG44 silicon UHF low-noise transistor |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1602-1980 |
|
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 15651-1995 |
Semiconductor devices Discrete devices and integrated circuits Part 5: Optoelectronic devices |
 (USD) |
via email in
1-10 business day
|
VALID
|
|
| GB/T 17573-1998 |
Semiconductor devices Discrete devices and integrated circuits Part 1:General |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ 1608-1980 |
|
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| SJ 1609-1980 |
|
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
|
|
